Acronyms: XRF = x-ray fluoresencence; RBS = Rutherford Backscattering; XRD = x-ray diffraction; SEM = scanning electron microscopy; AFM = atomic force microcopy; PES
= photoelectron spectroscopy, with x-rays (XPS) and ultraviolet (UPS); KP = Kelvin probe measurements, SECM = scanning electrochemical microscopy, PL = photoluminescence; FTIR = Fourier transform infrared spectroscopy
As shown in Fig. 1b, the shoulder at lower binding energies becomes comparatively weaker at the larger θ
= 40 °
photoelectron emission angle (with respect to the surface normal) when compared to spectra taken at θ
= 20 °.