Sentences with phrase «force scanning probe»
materials characterization by atomic force scanning probe and electron microscopy, spectrophotometry, custom apparatus for measurement of electrical and thermal transport properties (superconductors) at low temperatures
http://www.southernct.edu/ Not exact matches
The probe of an atomic force microscope (AFM) scans a surface to reveal details at a resolution 1,000 times greater than that of an optical microscope.
The atomic force microscope (AFM) has largely been a physicists» tool, scanning atomic landscapes with its ultrafine probe.
In atomic force microscopy (AFM), a silicon probe scans across a surface and builds a 3D image of the cells it encounters, much like someone reading a relief map with their fingers.
The experiment is based on atomic force microscopy where sample surfaces are scanned with the apex of a needle - like probe.
Scientists have imaged and manipulated ferroelectric properties using a particular type of scanning probe microscopy called piezo - response force microscopy (PFM).
Jacobs» team precisely measured the friction between silicon dioxide (SiO2) layers of different thicknesses and the 200 - nm tip of an atomic force microscopy probe by carefully scanning the tip across the wafer surface.
The researchers then used a dynamic force - scanning probe microscope for single - molecule force spectroscopy as well as antibody - recognition force microscopy (Ig - RFM) to map the locations of MtrC and OmcA on the surface of live Shewanella cells.
Grazing - Incidence Small Angle X-ray Scattering, Atomic Force Microscopy, Scanning Electron Microscopy, X-ray Photoelectron Spectrometry, and Kelvin Probe Force Microscopy have been used to follow each step of the fabrication process.
The research team consisting of Oscar Custance and Tomoko Shimizu, group leader and senior scientist, respectively, at the Atomic Force Probe Group, NIMS, Daisuke Fujita and Keisuke Sagisaka, group leader and senior researcher, respectively, at the Surface Characterization Group, NIMS, and scientists at Charles University in the Czech Republic, Autonomous University of Madrid in Spain, and other organizations combined simultaneous atomic force microscopy (AFM) and scanning tunneling microscopy (STM) measurements with first - principles calculations for the unambiguous identification of the atomic species at the most stable surface of the anatase form of titanium dioxide (hereinafter referred to as anatase) and its most common defForce Probe Group, NIMS, Daisuke Fujita and Keisuke Sagisaka, group leader and senior researcher, respectively, at the Surface Characterization Group, NIMS, and scientists at Charles University in the Czech Republic, Autonomous University of Madrid in Spain, and other organizations combined simultaneous atomic force microscopy (AFM) and scanning tunneling microscopy (STM) measurements with first - principles calculations for the unambiguous identification of the atomic species at the most stable surface of the anatase form of titanium dioxide (hereinafter referred to as anatase) and its most common defforce microscopy (AFM) and scanning tunneling microscopy (STM) measurements with first - principles calculations for the unambiguous identification of the atomic species at the most stable surface of the anatase form of titanium dioxide (hereinafter referred to as anatase) and its most common defects.
WITec is the leading German manufacturer of confocal and scanning - probe microscopes for Raman, Atomic Force, and Scanning Near - Field Optical Micscanning - probe microscopes for Raman, Atomic Force, and Scanning Near - Field Optical MicScanning Near - Field Optical Microscopy.
To celebrate the 30th anniversary of the Nobel Prize in scanning tunnelling microscopy (STM) and the 30th anniversary since the first paper in atomic force microscopy (AFM), Nanotechnology ™ has been organising a focus collection with guest editors Franz Giessibl, Rodolfo Miranda and Johannes Barthes to collate some of the latest cutting - edge progress developing and exploiting these scanning probe techniques.
Adding FluidFM ® enables measurements up to 50nN and even higher, giving us a broader range of force control than with any other instrument - scanning probe microscopy (SPM) combination.
nanoManipulator: uses virtual reality (VR) goggles and a force feedback probe as an interface to a scanning probe microscope, providing researchers with a new way to interact with the atomic world.
Acronyms: XRF = x-ray fluoresencence; RBS = Rutherford Backscattering; XRD = x-ray diffraction; SEM = scanning electron microscopy; AFM = atomic force microcopy; PES = photoelectron spectroscopy, with x-rays (XPS) and ultraviolet (UPS); KP = Kelvin probe measurements, SECM = scanning electrochemical microscopy, PL = photoluminescence; FTIR = Fourier transform infrared spectroscopy
Neuchatel, Switzerland About Blog NanoWorld AG is the outstanding world market leader of high quality SPM and AFM tips for Scanning Probe Microscopy (SPM) and Atomic Force Microscopy (AFM) with a market share of more than 50 %.
Neuchatel, Switzerland About Blog NanoWorld AG is the outstanding world market leader of high quality SPM and AFM tips for Scanning Probe Microscopy (SPM) and Atomic Force Microscopy (AFM) with a market share of more than 50 %.
Neuchatel, Switzerland About Blog NanoWorld AG is the outstanding world market leader of high quality SPM and AFM tips for Scanning Probe Microscopy (SPM) and Atomic Force Microscopy (AFM) with a market share of more than 50 %.