Sentences with phrase «multi-probe scanning probe microscopes»

PFM measures the dynamic, electromechanical response when a voltage is applied to a scanning probe microscope (SPM) tip in mechanical contact with the sample's surface.

His «nanotomography» method turns a scanning probe microscope on successive layers of a material to build up three - dimensional images of its innards at the nanometer scale.

The IBM team turned to a scanning probe microscope, which has a needle - sharp tip that «feels» a material's shape.

The group has developed liquid - helium cooled scanning probe microscopes (SPMs) that can image electron motion through a two dimensional electron gas, in GaAs / AlGaAs and graphene / hBN layered structures.

The researchers then used a dynamic force - scanning probe microscope for single - molecule force spectroscopy as well as antibody - recognition force microscopy (Ig - RFM) to map the locations of MtrC and OmcA on the surface of live Shewanella cells.

One path to advanced nanotechnologies begins with using scanning probe microscopes (SPM) to make atomically precise surface modifications — see, for example p. xii of Productive Nanosystems: A Technology Roadmap.

His research over the last 25 years has focused on the development and application of new scanning probe microscopes, including the invention of two new types of high - speed AFM and the use of nanotools controlled by holographic optical tweezers to act as a new type of AFM probe.

Since the development of new nanoscale measurement methods is also a high priority, we are developing multi-probe scanning probe microscopes and other cutting - edge instruments.

nanoManipulator: uses virtual reality (VR) goggles and a force feedback probe as an interface to a scanning probe microscope, providing researchers with a new way to interact with the atomic world.

Integrating a traditional optical microscope with an excellent laser scanning microscope (LSM) and a nanometric - scale scanning probe microscope (SPM), the OLYMPUS LEXT OLS4500 is compatible with a wide range of samples, providing a total observation / measurement solution for a new era.

Not exact matches

• The scanning tunnelling microscope measures changes in electrical current between the probe tip and the atoms on a sample surface.

Vortices in superconductors can be probed with a scanning tunneling microscope.

Juan Carlos Cuevas at the Autonomous University of Madrid in Spain and his colleagues modified a scanning tunnelling microscope — which allows the manipulation and imaging of atoms — to trap a ring of benzene between the probing tip of the microscope and a flat gold surface.

The probe of an atomic force microscope (AFM) scans a surface to reveal details at a resolution 1,000 times greater than that of an optical microscope.

The atomic force microscope (AFM) has largely been a physicists» tool, scanning atomic landscapes with its ultrafine probe.

Data is read by scanning gaps between atoms and the microscope's probe.

The probe of a scanning tunneling microscope has a tip, sharpened to only a few atoms, that hovers several angstroms above the surface to be imaged.

Samus Davis of the University of California, Berkeley, together with Shin - ichi Uchida of the University of Tokyo and colleagues used a scanning tunneling microscope to probe the behavior of Bi-2212, a high - Tc superconductor that belongs to a class of compounds known as BSCCOs.

Lithium batteries can't survive immersion, and saltwater corrodes electronics, but forensics experts can tease apart microchips and, if necessary, use scanning electron microscopes to probe the data stored in components like solid state memory chips.

However, researchers were able to both culture samples from the medical equipment and see it on the surface of temperature probes using a scanning electron microscope.

Those probes can image a surface at the atomic level by detecting the tunneling of electrons from the surface across a small gap to the microscope's tiny scanning tip.

A magnetized scanning tunneling microscope tip was used to probe the spin property of the quantum wave function of the Majorana fermion at the end of a chain of iron atoms on the surface of a superconductor made of lead.

Eigler's breakthrough was made possible thanks to the invention of the scanning tunneling microscope (STM) by Gerd Binning and Heinrich Rohrer in 1981, a device that made possible the imaging of atoms by measuring changes in the way electrons hop between a sharp probe and a specimen, as the probe shifts position.

WITec is the leading German manufacturer of confocal and scanning - probe microscopes for Raman, Atomic Force, and Scanning Near - Field Optical Micscanning - probe microscopes for Raman, Atomic Force, and Scanning Near - Field Optical MicScanning Near - Field Optical Microscopy.

UltraSPX - 200 / 220 - Ultra-high Resolution Analytical Scanning - Probe X-ray Microscope for Synchrotron Facilities.

In this case, tungsten probes were attached to a scanning tunneling microscope.