It is shown that the acoustic
phonon lifetimes can be tuned both by strain engineering of the suspended structures and strain modification by temperature variation in addition to a strong dependence on the thickness of the suspended structures [1].
Even in the case of the extensively studied group IV semiconductors, measurements of
phonon lifetimes are scarce and the impact of strain engineering is not well understood.
In new neutron experiments conducted at the Institut Laue - Langevin (ILL) and the French National Centre for Scientific Research (CNRS), researchers have provided a direct quantitative measurement of
phonon lifetimes in a clathrate, offering a novel picture of thermal conductivity in...
Whereas the «glass - like» thermal conductivity of the clathrate Ba7.81 Ge40.67 Au5.33 has frequently been associated with a short
phonon lifetime, this study measured for the first time to date a very long
phonon lifetime using a large single crystal sample of high quality.
A multi-partner study published today in Nature Communications has addressed
phonon lifetime measurement challenges using inelastic neutron scattering (INS) and neutron resonant spin - echo (NRSE) experiments conducted at the Institut Laue Langevin (ILL) in Grenoble, and Laboratoire Léon Brillouin (LLB) Saclay, France.
Not exact matches
Systematic analysis is performed based on the study of the contribution from
phonon branches, comparison among the mode level
phonon group velocity and
lifetime, the detailed process and channels of
phonon —
phonon scattering, and
phonon anharmonicity with potential energy well.