The researchers used high -
resolution scanning electron microscopy with energy dispersive x-ray analysis to study microstructure and elemental composition, and high -
resolution x-ray
photoelectron spectroscopy for more detailed chemical characterization.
He brings a variety of in situ and ex situ characterization methods to bear on the these materials, including high -
resolution x-ray and ultraviolet
photoelectron spectroscopy, x-ray diffraction, Rutherford backscattering, scanning transmission electron microscopy, electron energy loss spectroscopy, atom probe tomography and scanning probe microscopy.