Not exact matches
Xin and his collaborators rotated 20 - nanometer - thick sheets of the post-reaction material inside a carefully calibrated
transmission electron microscope (TEM) grid at CFN to catch the contours from every angle — a process called
electron tomography.
Doctoral student Florian Vogel and Dr. Nelia Wanderka from the HZB Institute of Applied Materials have elegantly combined two methods to accomplish this:
transmission electron microscopy (TEM) and atom probe
tomography (APT), which they carried out in collaboration with colleagues from the University of Münster.
To make their determination, researchers used a combination of analytical techniques, including atom probe
tomography,
transmission electron microscopy and
electron beam induced current.
Researchers used the 12 - ID - B and 32 - ID beamlines at the Advanced Photon Source, also a DOE Office of Science User Facility, to take X-ray scattering measurements, as well as
transmission X-ray microscopy nano - computed
tomography of the samples, scanning
electron microscopy and
transmission electron microscopy.
He brings a variety of in situ and ex situ characterization methods to bear on the these materials, including high - resolution x-ray and ultraviolet photoelectron spectroscopy, x-ray diffraction, Rutherford backscattering, scanning
transmission electron microscopy,
electron energy loss spectroscopy, atom probe
tomography and scanning probe microscopy.
The positions of 3769 tungsten atoms in a tungsten needle segment were determined to a precision of 19 pm (0.019 nm), including the position of a single atom defect in the interior of the sample, by using aberration - corrected scanning
transmission electron microscopy and computerized
tomography.