He brings a variety of in situ and ex situ characterization methods to bear on the these materials, including high - resolution x-ray and
ultraviolet photoelectron spectroscopy, x-ray diffraction, Rutherford backscattering, scanning transmission electron microscopy, electron energy loss spectroscopy, atom probe tomography and scanning probe microscopy.
Not exact matches
In particular,
photoelectron spectroscopy with extreme
ultraviolet (XUV) radiation is a powerful method to probe the electron density in a valence shell of a molecular system.
Acronyms: XRF = x-ray fluoresencence; RBS = Rutherford Backscattering; XRD = x-ray diffraction; SEM = scanning electron microscopy; AFM = atomic force microcopy; PES =
photoelectron spectroscopy, with x-rays (XPS) and
ultraviolet (UPS); KP = Kelvin probe measurements, SECM = scanning electrochemical microscopy, PL = photoluminescence; FTIR = Fourier transform infrared spectroscopy